Will ASM330LHB be damaged by self test during high dynamic conditions?

[Pavani]

In ASM330LHB datasheet, gyro and accelerometer self test to be executed only when device is in static condition. But in field operating environment, device may goes into high dynamic condition during self test active, then

is ASM330 device gets damaged ?  OR device will be ok but only self test results will be failed?

Thanks is advance,

Pavani.

[Andrew Neil]

If the datasheet says the the Self-Test is only to be executed in static conditions, why would you perform a self-test in other conditions?

The results won't be valid!

[Pavani]

In field operating environment, device may goes into high dynamic condition from static condition when self test being executed. This situation that device goes from static to dynamic conditions (during self test being executed )in field operating environment is cannot controlled? 

example Case :

In our application board, we have 30 numbers of ASM330LHB, for which self testing will be done in sequence manner.  So total time for self test of 30 number is around 30 x 0.5 sec =  15 sec.  There are very high chances that our application board goes into dynamic from static within these 15 seconds.

 

The results won't be valid!... this is OK. But is Device get damaged if self test executed in dynamic conditions? Or device will be fine?

 

Thank you,

K.Venkatarao

 

 

[Andrew Neil]

The point is that you should not be initiating a self-test unless you know that the system will be in a static state.