LM335 (LM235) damage issue

A high-frequency DC testing power supply product that uses LM235 to measure the temperature of the heat sink (aluminum), and the measurement circuit is shown in the above figure:
The temperature range of the radiator is also within the temperature range of LM235 (TO-92/-40 ℃,+125 ℃). The product is placed in a high-temperature box for 40 ℃ full power aging test. The maximum temperature of the aluminum heat sink is about 90 ℃, and the aging test time is 6 hours;
During the aging process, if the temperature value detected by LM235 (voltage between measurement positions ① and ②, refer to the circuit diagram) is about 20 ℃ higher than the actual temperature (aluminum radiator), it will cause the product to have a false alarm (HOT-ERR);
Question 1:
This temperature measurement circuit has not been adjusted in any way, and LM335, which has been used for 23 years, has basically not had this problem; Recently, there have been multiple instances of LM335 being damaged, and now replacing it with LM235 also results in damage (with a significantly higher probability of failure than LM335). What are the reasons that can cause such a large measurement error in LM235 (LM335)?
Question 2:
The capacitance of C111 in the circuit diagram is 470nF. What is the impact of adjusting it to 1uF on the temperature sampling value?
