when generating noise(EMC test) system goes down

[vzout.1]

Hi,

We build a IC board with STM32G0 and ST25 NFC/RFID tag. It use also an EMI (AN5248) (I²C, Timers are used on the STM32). Reading Tag is OK. But when generating noise(EMC test) on SCL and tag is detected at the same time, the system goes down. ??

[Brian TIDAL]

Hi,

which ST25 tag is being used?

which reader is being used? ST25R95/CR95HF reader ? Reader on X-NUCLEO board or on Discovery board?

Which part of the system goes low? Tag or reader? and what do you mean by "goes low": abort handler? reset? etc??

Rgds

BT

[vzout.1]

Hi,

This is a ST25R95-VMD5T on STM32G030C8T. I mean, after reading tag while generating noise on SCL, the system does not respond anymore. Even for reading another tag. The I2C does not work anymore. And timers are broken configuration.

[Brian TIDAL]

Hi,

ST25R95-VMD5T uses SPI for serial communication with the MCU so "I2C does not work anymore" seems mysterious to me.

Can you precisely describe your hardware setup?

On FW side, do you use ST RFAL library to drive the ST25R95 or your own code? Have you tried to connect a debugger on the STM32G030 MCU to check whether the MCu is in abort etc.?

Can you connect a logic analyzer on the SPI (CLK, MOSI, MISO, SS) and IRQ_OUT and provide a trace?

Thanks

Rgds

BT