Application to stress in climatic chamber a STM32H7A3IIK6
Hi everbody. I've developed a project for STM32H7A3IIK6 [BGA package] and i've mounted the bypass capacitor on the same side of the MCU [not on the opposite side as suggested by STM Application Note] because of problems related to my production process. Now i'd like to write an application to stress my MCU in climatic chamber to understand if, in this configuration, i could have problems like HardFault or similar. Is there in CubeMX or in some github STM repository, for this MCU [or similar], any kind of benchmark/application to stress the MCU? Could you suggest me what to implement to stress the MCU?
