VL53 as a reflectometer
Hi,
I want to create a reflectometer to measure samples targets reflectivity in %. The samples are 10x15cm and the distance will be fixed: samples can be between 15cm to 1m. The measurement will happen in the dark in a controlled environment.
I found the ST reflectometer demo page so I thought it may be viable to use a VL53 ToF sensor. However, there is not much technical explanations : https://www.st.com/en/embedded-software/stsw-img018.html
So, I am currently investigating the idea of using a VL53 sensor. My first question is : is it a good idea ? If any, what would be the best VL53xx device for this purpose. If it is not a good idea do you have any suggestion or something to look for ?
I think reflectivity should be proportional to the signal rate in kcps multiplied by the number of active SPADs. I guess I can ignore the distance because it is fixed.
I have a VL53L1 and a board, so I made a basic test with reference materials placed at 20cm in a closed box. But for some reason the signal rate (signal rate x SPADs count) is not proportional between a black paper (around 5% reflectivity) and a white (around 90%). Does anyone know if it is a valid approach ? I have not found many resources for this problem.
Thanks a lot !
